Title:
METHOD AND SYSTEM FOR MEASURING OPTICAL PROPERTIES OF A MEDIUM USING DIGITAL COMMUNICATION PROCESSING TECHNIQUES
Document Type and Number:
WIPO Patent Application WO2005047871
Kind Code:
A3
Abstract:
A system (20) for measuring properties of a medium (30) includes an electromagnetic generator (26) for forming a CW carrier, a digital encoder (24) for forming a digital message, and a modulator (28) for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium (30) provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver (32) configured to receive the propagated, digitally modulated CW carrier, and a processor (56) for measuring at least one property of the medium. The medium (30) may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.
Inventors:
MENDENHALL SCOTT NELSON (US)
DOBBS MICHAEL E (US)
NEFF BENJAMIN R (US)
MCADOO JAMES ALEXANDER (US)
DOBBS MICHAEL E (US)
NEFF BENJAMIN R (US)
MCADOO JAMES ALEXANDER (US)
Application Number:
PCT/US2004/038085
Publication Date:
September 22, 2005
Filing Date:
November 01, 2004
Export Citation:
Assignee:
ITT MFG ENTERPRISES INC (US)
MENDENHALL SCOTT NELSON (US)
DOBBS MICHAEL E (US)
NEFF BENJAMIN R (US)
MCADOO JAMES ALEXANDER (US)
MENDENHALL SCOTT NELSON (US)
DOBBS MICHAEL E (US)
NEFF BENJAMIN R (US)
MCADOO JAMES ALEXANDER (US)
International Classes:
G01N21/35; G01S7/48; (IPC1-7): G01N21/35
Domestic Patent References:
| WO2003040894A2 | 2003-05-15 | |||
| WO2003084281A1 | 2003-10-09 |
Foreign References:
| US4480190A | 1984-10-30 | |||
| US20020037033A1 | 2002-03-28 |
Other References:
PATENT ABSTRACTS OF JAPAN vol. 2003, no. 06 3 June 2003 (2003-06-03)
PATENT ABSTRACTS OF JAPAN vol. 2002, no. 12 12 December 2002 (2002-12-12)
BERBER S M ED - INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS: "An automated method for BER characteristics measurement", IMTC 2001. PROCEEDINGS OF THE 18TH. IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. BUDAPEST, HUNGARY, MAY 21 - 23, 2001, IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. (IMTC):, NEW YORK, NY : IEEE, US, vol. VOL. 1 OF 3. CONF. 18, 21 May 2001 (2001-05-21), pages 1491 - 1495, XP010547209, ISBN: 0-7803-6646-8
PATENT ABSTRACTS OF JAPAN vol. 2002, no. 12 12 December 2002 (2002-12-12)
BERBER S M ED - INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS: "An automated method for BER characteristics measurement", IMTC 2001. PROCEEDINGS OF THE 18TH. IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. BUDAPEST, HUNGARY, MAY 21 - 23, 2001, IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. (IMTC):, NEW YORK, NY : IEEE, US, vol. VOL. 1 OF 3. CONF. 18, 21 May 2001 (2001-05-21), pages 1491 - 1495, XP010547209, ISBN: 0-7803-6646-8
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