MONITORING DEVICE, MONITORING METHOD AND PROGRAM

WIPO Patent Application WO/2013/035264

A1

A monitoring device (1) that comprises: an inspection result acquisition unit (10) that acquires inspection results of multiple inspection items implemented on each of multiple items to be monitored; a conversion rule holding unit (20) that holds conversion rules existing for the purpose of computing conversion values using the inspection results, said conversion values indicating, on the same scale, the condition of each of the inspection items for each of the items to be monitored; a conversion unit (30) that computes conversion values by using the inspection results acquired by the inspection result acquisition unit (10), and by using the conversion rules; a group-by-group evaluation unit (40) that for each item to be monitored, classifies multiple inspection items into multiple groups, and for each group, uses the conversion values of the inspection items classified into the group to compute evaluation values; and an output unit (50) that outputs the evaluation values in association with each item to be monitored.

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WO/2019/032189	SYSTEMS AND METHODS FOR AUDITING ISOLATED COMPUTING ENVIRONMENTS

YOSHIDA HARUKA (JP)

PCT/JP2012/005355

March 14, 2013

August 27, 2012

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NEC CORP (JP)
YOSHIDA HARUKA (JP)

G06F11/34; G06F11/30

JP2007207173A	2007-08-16
JP2009211658A	2009-09-17
JP2008146591A	2008-06-26

HAYAMI, SHINJI (JP)
Shinji Hayami (JP)

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