Title:
NANOSCALE PARTICLES USED IN NEGATIVE ELECTRODE FOR LITHIUM ION SECONDARY BATTERY AND METHOD FOR MANUFACTURING SAME
Document Type and Number:
WIPO Patent Application WO/2012/063762
Kind Code:
A1
Abstract:
The problem addressed by the present invention is providing a negative electrode material for use in a lithium ion secondary battery that achieves high capacity and good cycle characteristics. The means for addressing this problem is nanoscale particles characterized by having a first phase, which is a simple substance or solid solution of an element (A) such as Si, Sn, Al, Pb, Sb, Bi, Ge, In, and Zn and at least another layer which is a compound of an element (D) such as Fe, Co, Ni, Ca, Sc, Ti, V, Cr, Mn, Sr, Y, Zr, Nb, Mo, Ru, Rh, Ba, lanthanoid elements (other than Ce and Pm), Hf, Ta, W, and Ir and the element (A), or a compound of the element (A) and an element (M) such as Cu, Ag, and Au. The nanoscale particles are further characterized by the first phase and the other phase being joined via an interface, the first phase and the other phase being exposed on the outside surface, and the first phase having, other than the interface, substantially spherically shaped surfaces. The problems are also addressed by a lithium ion secondary battery that includes the nanoscale particles as a negative electrode active material.
Inventors:
NISHIMURA TAKESHI (JP)
TANI TOSHIO (JP)
SHIMADA MICHIHIRO (JP)
KUBOTA MASAAKI (JP)
ABE HIDETOSHI (JP)
EGURO TAKASHI (JP)
TANI TOSHIO (JP)
SHIMADA MICHIHIRO (JP)
KUBOTA MASAAKI (JP)
ABE HIDETOSHI (JP)
EGURO TAKASHI (JP)
Application Number:
PCT/JP2011/075556
Publication Date:
May 18, 2012
Filing Date:
November 07, 2011
Export Citation:
Assignee:
FURUKAWA ELECTRIC CO LTD (JP)
FURUKAWA BATTERY CO LTD (JP)
NISHIMURA TAKESHI (JP)
TANI TOSHIO (JP)
SHIMADA MICHIHIRO (JP)
KUBOTA MASAAKI (JP)
ABE HIDETOSHI (JP)
EGURO TAKASHI (JP)
FURUKAWA BATTERY CO LTD (JP)
NISHIMURA TAKESHI (JP)
TANI TOSHIO (JP)
SHIMADA MICHIHIRO (JP)
KUBOTA MASAAKI (JP)
ABE HIDETOSHI (JP)
EGURO TAKASHI (JP)
International Classes:
B22F9/02; B22F1/054; B22F1/17; C22C1/05; H01M4/134; H01M4/36; H01M4/38; H01M4/42; H01M4/46; H01M4/48; H01M4/62
Domestic Patent References:
| WO2007015508A1 | 2007-02-08 |
Foreign References:
| JP2002124254A | 2002-04-26 | |||
| JP2004335272A | 2004-11-25 | |||
| JP2007172858A | 2007-07-05 | |||
| JP2009538981A | 2009-11-12 | |||
| JPS63221842A | 1988-09-14 | |||
| JP2005240099A | 2005-09-08 | |||
| JP2011034836A | 2011-02-17 | |||
| JP2011034839A | 2011-02-17 | |||
| JP2011032541A | 2011-02-17 |
Attorney, Agent or Firm:
INOUE, SEIICHI (JP)
Seiichi Inoue (JP)
Seiichi Inoue (JP)
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Claims: