NEAR-FIELD POLARIZATION MICROSCOPE

WIPO Patent Application WO/2016/024629

A1

[Problem] To provide a near-field polarization microscope with which it is possible to accurately detect a magnetic domain in a sample while applying a magnetic field to the sample from the outside. [Solution] This near-field polarization microscope 1 is provided with: a cantilever 3 having a probe 2; a magnetic domain detection optical system 4 for detecting a magnetic domain in a sample 8 using near-field light produced by irradiating the probe 2 with a magnetic domain detection laser beam 11; an observation illumination optical system 5 for observing the state of irradiation by the magnetic domain detection laser beam 11; an objective lens 6 shared by the magnetic domain detection optical system 4 and the observation illumination optical system 5; and a magnetic field application means 7 for applying a magnetic field to the sample 8 from the outside. The cantilever 3, which is formed from a non-magnetic and electrically non-conductive material, and the sample 8, which is formed from a magnetic material, are arranged between an upper magnetic pole 43 and a lower magnetic pole 44 provided to the magnetic field application means 7.

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JP2005070031	COMPONENT ANALYZER USING MICROCHIP
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HOSAKA SUMIO (JP)
SONE HAYATO (JP)
YIN YOU (JP)
MIURA TAKESHI (JP)

PCT/JP2015/072930

February 18, 2016

August 13, 2015

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UNISOKU CO LTD (JP)
UNIV GUNMA NAT UNIV CORP (JP)

G01Q60/18

JP2008175651A	2008-07-31
JP2003344258A	2003-12-03
JPH09293288A	1997-11-11
JP2007108088A	2007-04-26

WATANABE MITSUHIKO (JP)
Mitsuhiko Watanabe (JP)

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