Title:
OPTICAL INSPECTION METHOD AND APPARATUS USING SAME
Document Type and Number:
WIPO Patent Application WO/2021/040409
Kind Code:
A1
Abstract:
An optical inspection apparatus and an inspection method are disclosed. The disclosed inspection method is a method of optically inspecting a surface of a product, and comprises the steps of: sequentially illuminating at least one surface of the product by means of at least two light sources; blocking at least one of direct light and reflected light of light illuminated by means of the at least two light sources from entering at least one camera by means of at least one from among at least one aperture and a light absorbing box ; and capturing a set of images of the at least one surface by means of the at least one camera.
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Inventors:
POPOV MIKHAIL VYACHESLAVOVICH (RU)
SHTYKOV STANISLAV ALEKSANDROVICH (RU)
MALYSHEV ILIA VALER'EVICH (RU)
BURMAK LIUDMILA IGOREVNA (RU)
FILIMONOV PAVEL ANATOLYEVICH (RU)
TURKO SERGEY ALEXANDROVICH (RU)
ASPIDOV ALEXANDER ALEKSEYEVICH (RU)
SHTYKOV STANISLAV ALEKSANDROVICH (RU)
MALYSHEV ILIA VALER'EVICH (RU)
BURMAK LIUDMILA IGOREVNA (RU)
FILIMONOV PAVEL ANATOLYEVICH (RU)
TURKO SERGEY ALEXANDROVICH (RU)
ASPIDOV ALEXANDER ALEKSEYEVICH (RU)
Application Number:
PCT/KR2020/011416
Publication Date:
March 04, 2021
Filing Date:
August 26, 2020
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G01N21/88; G06N3/08; G06N20/00
Foreign References:
| KR20160004099A | 2016-01-12 | |||
| US7162073B1 | 2007-01-09 | |||
| US20060115143A1 | 2006-06-01 | |||
| US20180075594A1 | 2018-03-15 | |||
| KR20130139747A | 2013-12-23 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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