Title:
PATTERN GENERATION DEVICE AND TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2005/008263
Kind Code:
A1
Abstract:
There is provided a pattern generation device for generating a test pattern for performing a scan test of an electronic device. The pattern generation device includes: a main memory for correlating a scan pattern data block containing pattern data for performing a scan test to a scan sequence data block containing an instruction indicating the sequence for supplying data of the scan pattern data block to the electronic device and storing them; and a data spreading section for executing the instruction in the scan sequence data block so as to spread pattern data in the corresponding scan pattern data block, thereby generating a test pattern.
Inventors:
NAKAYAMA HIROYASU (JP)
Application Number:
PCT/JP2004/009665
Publication Date:
January 27, 2005
Filing Date:
July 07, 2004
Export Citation:
Assignee:
ADVANTEST CORP (JP)
NAKAYAMA HIROYASU (JP)
NAKAYAMA HIROYASU (JP)
International Classes:
G01R31/3185; G01R31/3183; G01R31/319; G06F11/22; (IPC1-7): G01R31/28
Foreign References:
| JPS61201343A | 1986-09-06 | |||
| JPS55143469A | 1980-11-08 | |||
| JP2002528725A | 2002-09-03 | |||
| US5606568A | 1997-02-25 | |||
| JPH04289472A | 1992-10-14 | |||
| JP2003139819A | 2003-05-14 |
Other References:
See also references of EP 1662265A4
Attorney, Agent or Firm:
Ryuka, Akihiro (24-12 Shinjuku 1-chom, Shinjuku-ku Tokyo 22, JP)
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