Title:
PID CONTROL DEVICE AND PID CONTROL METHOD
Document Type and Number:
WIPO Patent Application WO/2017/077565
Kind Code:
A1
Abstract:
The present invention is provided with: an elapsed time measurement unit 6 that monitors the temperature T of a control target 1, performs processing to detect the time at which the temperature T of the control target 1 passes a set temperature Tref, and measures an elapsed time tela from the previous passage time until the current passage time; and a remaining time calculation unit 7 that uses the elapsed time tela measured by the elapsed time measurement unit 6 to calculate a remaining time trest until auto-tuning ends. A remaining time display unit 8 displays, on a 7 segment display unit, the remaining time trest calculated by the remaining time calculation unit 7. Due to such a configuration, a user is able to ascertain the remaining time until auto-tuning ends.
Inventors:
YAMASHITA KENTAROU (JP)
MIYASHITA NORIAKI (JP)
FUKUDA KEIJI (JP)
NICYOUGI MASATO (JP)
ARAI TAKASHI (JP)
MASE TAKAHIRO (JP)
TAKAHASHI KOUTA (JP)
MIYASHITA NORIAKI (JP)
FUKUDA KEIJI (JP)
NICYOUGI MASATO (JP)
ARAI TAKASHI (JP)
MASE TAKAHIRO (JP)
TAKAHASHI KOUTA (JP)
Application Number:
PCT/JP2015/080886
Publication Date:
May 11, 2017
Filing Date:
November 02, 2015
Export Citation:
Assignee:
RKC INSTRUMENTS INC (JP)
International Classes:
G05B11/36; G05B11/42; G05B13/02
Domestic Patent References:
WO2014087805A1 | 2014-06-12 |
Foreign References:
JP2008064322A | 2008-03-21 | |||
JPH10108788A | 1998-04-28 | |||
JP3211444B2 | 2001-09-25 | |||
JP2802460B2 | 1998-09-24 |
Attorney, Agent or Firm:
KATO, Masanobu et al. (JP)
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