Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SEMICONDUCTOR MEMORY DEVICE HAVING FAULTY CELLS
Document Type and Number:
WIPO Patent Application WO/1997/032253
Kind Code:
A1
Abstract:
A semiconductor memory device having an electrically erasable nonvolatile memory, wherein the nonvolatile memory has management information regions for individual blocks and fault registration regions for registering fault addresses. If a block is accessed and found to be faulty, the fault registration is performed so that a partially faulty memory can be used without an increase in access time. By registering the management information address for executing the interchanges of blocks in one-to-one correspondence in the administrative information region, moreover, the blocks can be interchanged depending upon the frequency of rewriting.

Inventors:
KATAYAMA KUNIHIRO (JP)
TAMURA TAKAYUKI (JP)
WATATANI SATOSHI (JP)
INOUE KIYOSHI (JP)
SHIOTA SHIGEMASA (JP)
NAITO MASASHI (JP)
Application Number:
PCT/JP1996/003501
Publication Date:
September 04, 1997
Filing Date:
November 29, 1996
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD (JP)
KATAYAMA KUNIHIRO (JP)
TAMURA TAKAYUKI (JP)
WATATANI SATOSHI (JP)
INOUE K (JP)
SHIOTA SHIGEMASA (JP)
NAITO MASASHI (JP)
International Classes:
G11C7/00; G11C11/34; G11C16/06; G11C29/00; H04L12/28; G06F11/20; (IPC1-7): G06F12/16; G11C16/06; G11C29/00
Foreign References:
JPH04311236A1992-11-04
JPH04308971A1992-10-30
JPH0567005A1993-03-19
JPH05274219A1993-10-22
JPH0620483A1994-01-28
JPH0756816A1995-03-03
JPH03131951A1991-06-05
JPS62239252A1987-10-20
JPS63219045A1988-09-12
Download PDF: