Title:
SPECIMEN INSPECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/212235
Kind Code:
A1
Abstract:
The present invention relates to a specimen inspecting method for minimizing, in a specimen, the remainder of material that did not react with a target material, by using a gel patch and, specifically, to a specimen inspecting method comprising the steps of: preparing, above a specimen, a patch in which an inspection reagent is stored; lowering, by a first distance, the patch toward the specimen; lifting, by a second distance, the patch in the direction away from the specimen; and lifting, by a third distance, the patch in a direction away from the specimen.
Inventors:
HONG SUNG HUN (KR)
LEE DONG YOUNG (KR)
LIM CHAN YANG (KR)
CHO JAE RYUN (KR)
SONG YOUNG HOON (KR)
LEE DONG YOUNG (KR)
LIM CHAN YANG (KR)
CHO JAE RYUN (KR)
SONG YOUNG HOON (KR)
Application Number:
PCT/KR2019/005215
Publication Date:
November 07, 2019
Filing Date:
April 30, 2019
Export Citation:
Assignee:
NOUL CO LTD (KR)
International Classes:
G01N33/53; B01L3/00; G01N1/31; G01N33/58
Foreign References:
| KR20170099786A | 2017-09-01 | |||
| KR100601831B1 | 2006-07-14 | |||
| KR20070078556A | 2007-08-01 | |||
| US20140038230A1 | 2014-02-06 | |||
| US4250257A | 1981-02-10 |
Attorney, Agent or Firm:
Y.P. LEE, MOCK & PARTNERS (KR)
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