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Title:
SPECTROSCOPIC DEVICE AND WAVELENGTH CORRECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/101078
Kind Code:
A1
Abstract:
This spectroscopic device comprises: a correction light source (3); an optical filter (6) that transmits light of a prescribed wavelength region from the light from the correction light source (3); an incidence slit (SL) on which the following are incident: light (L1) to be measured and correction light (L2) that has traversed the optical filter (6) from the correction light source (3); a dispersion means (12) that disperses, into a dispersion image at each wavelength, the light to be measured that has passed through the incidence slit (SL) during measurement of the light to be measured, and the correction light that has passed through the incidence slit (SL) during wavelength correction; a light-receiving sensor (13) that receives the dispersion image; and an operation control means (7) that, during wavelength correction and on the basis of the correction light, determines the amount of shift from an initial position of a light-receiving position at the light-receiving sensor (13) of the dispersion image and carries out wavelength correction.

Inventors:
KAWANO TOSHIO (JP)
Application Number:
PCT/JP2023/037373
Publication Date:
May 16, 2024
Filing Date:
October 16, 2023
Export Citation:
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Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J3/02; G01J3/36; G01M11/00
Domestic Patent References:
WO2019039025A12019-02-28
WO2019039024A12019-02-28
Foreign References:
JP2005069784A2005-03-17
JP2003090761A2003-03-28
JP2010237097A2010-10-21
JP2011242314A2011-12-01
JP2011089895A2011-05-06
Attorney, Agent or Firm:
TAKATA Kenichi (JP)
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