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Title:
STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, STANDARD SAMPLE, SAMPLE SET, QUANTITATIVE ANALYSIS METHOD, AND TRANSFER FILM
Document Type and Number:
WIPO Patent Application WO/2023/013417
Kind Code:
A1
Abstract:
The present invention provides: a standard sample film or a standard sample, which is used for laser ablation inductively coupled plasma mass spectrometry, the standard sample film or the standard sample containing an organic material and having a small variation in the signal intensity of ions of a metal element according to the measurement positions; a method for producing a standard sample film; a sample set; a quantitative analysis method; and a transfer film. A standard sample film according to the present invention is used for laser ablation inductively coupled plasma mass spectrometry; and this standard sample film contains a polymer, a metal element and an internal standard, while having a maximum height difference in the film thickness of the standard sample film of 0.50 μm or less.

Inventors:
HIRANA YASUHIKO (JP)
SUGIYAMA TAKURO (JP)
TERAO YUKO (JP)
IWATO KAORU (JP)
HIRATA TAKAFUMI (JP)
Application Number:
PCT/JP2022/028203
Publication Date:
February 09, 2023
Filing Date:
July 20, 2022
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
UNIV TOKYO (JP)
International Classes:
G01N27/62; G01N1/00; G01N23/2258; G01N27/64; H01J49/10; H01J49/26
Domestic Patent References:
WO2019202690A12019-10-24
WO2021157407A12021-08-12
Foreign References:
JP2018136190A2018-08-30
JP2004212206A2004-07-29
JP2013238455A2013-11-28
JP2018087779A2018-06-07
JP2005024332A2005-01-27
US20140238155A12014-08-28
JP2018136190A2018-08-30
US20080248425A12008-10-09
Other References:
ANONYMOUS: "Development of optimal reference materials for next-generation trace elemental analysis methods", FUJIFILM, 17 December 2020 (2020-12-17), XP093032576, Retrieved from the Internet [retrieved on 20230317]
SUZUKI, MASAHIRO; SEKINE, MASAHIRO: "Study on Simple Method to Distinguish the Origin of Food", REPORTS OF SAITAMA INDUSTRIAL TECHNOLOGY CENTER, SAITAMA INDUSTRIAL TECHNOLOGY CENTER, JP, vol. 6, 1 January 2008 (2008-01-01), JP , pages 1 - 4, XP009543315, ISSN: 1348-7299
"Surface Analysis Technology Library Secondary Ion Mass Spectrometry", 1999, MARUZEN CO., LTD.
Attorney, Agent or Firm:
ITOH Hideaki et al. (JP)
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