Title:
SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/100594
Kind Code:
A1
Abstract:
Provided are a substrate treatment method and a substrate treatment device, whereby it becomes possible to improve a film deposition rate. The substrate treatment method comprises repeating a step of feeding a silicon-containing gas to form an adsorbed layer on a substrate, a step of generating He-containing plasma to modify the adsorbed layer and a step of generating plasma of a reaction gas and reacting the adsorbed layer with the plasma, thereby forming a silicon-containing film.
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Inventors:
KAGAYA MUNEHITO (JP)
Application Number:
PCT/JP2020/042215
Publication Date:
May 27, 2021
Filing Date:
November 12, 2020
Export Citation:
Assignee:
TOKYO ELECTRON LTD (JP)
International Classes:
C23C16/455; C23C16/42; H01L21/31; H01L21/318
Foreign References:
JP2016066794A | 2016-04-28 | |||
JP2015510263A | 2015-04-02 | |||
JP2016063232A | 2016-04-25 |
Attorney, Agent or Firm:
ITOH, Tadashige et al. (JP)
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