Title:
SYSTEM FOR DETECTING TEMPERATURE OF SEMICONDUCTOR ELEMENT, SEMICONDUCTOR MODULE, AND SEMICONDUCTOR MODULE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2013/111863
Kind Code:
A1
Abstract:
A temperature data encoding unit (100) increases the data resolution of a high-temperature unit, decreases the data resolution of a low-temperature unit, and sets the data length of a set of temperature data as a fixed length. Moreover, when a numerical value is evaluated with the fixed-length encoding value functioning as the numerical encoding value of two's complement, the temperature data prior to being encoded is increased and a set of encoding data to be monotonically increased by the numerical evaluation value of two's complement is generated.
Inventors:
TANAKA TERUAKI (JP)
Application Number:
PCT/JP2013/051610
Publication Date:
August 01, 2013
Filing Date:
January 25, 2013
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
TANAKA TERUAKI (JP)
TANAKA TERUAKI (JP)
International Classes:
H01L23/34; H02M1/00
Foreign References:
| JP2011172336A | 2011-09-01 | |||
| JP2008051775A | 2008-03-06 | |||
| JPH0989588A | 1997-04-04 |
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
Hideaki Tazawa (JP)
Hideaki Tazawa (JP)
Download PDF:
Claims:
Previous Patent: METHOD FOR PRODUCING MASTER BATCH FOR CONDUCTIVE RESIN, AND MASTER BATCH
Next Patent: PEST CONTROL AGENT
Next Patent: PEST CONTROL AGENT