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Patent Searching and Data


Title:
TEST TRAY AND TEST HANDLER USING SAME
Document Type and Number:
WIPO Patent Application WO/2021/075667
Kind Code:
A1
Abstract:
A test tray, according to the present invention, for supporting at least one semiconductor module in order to test the semiconductor module, comprises: a tray body in which a support groove for supporting the semiconductor module is formed; and an insert which is installed in the support groove and by which the semiconductor module inserted into the support groove is fixed to the support groove. The insert includes: an insert body installed in the support groove and having an insertion groove into which the semiconductor module is inserted; a support clip extending downward from the insertion groove and supporting the lower end of the semiconductor module; a pressing clip accommodated in a side wall of the insertion body; and an elastic body which is installed inside the insert body and exerts an elastic force toward the insertion groove so that the pressing clip presses the semiconductor module. Thus, the present invention has the effect of allowing a significant reduction in equipment investment costs.

Inventors:
LEE TAEK SEON (KR)
YEO DONG HYUN (KR)
Application Number:
PCT/KR2020/008722
Publication Date:
April 22, 2021
Filing Date:
July 03, 2020
Export Citation:
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Assignee:
ATECO INC (KR)
International Classes:
G01R31/28; H01L21/673; H01L21/677; H01L21/68
Foreign References:
KR20090039442A2009-04-22
KR20090028024A2009-03-18
KR20090038102A2009-04-20
KR20110100522A2011-09-14
JP2000329809A2000-11-30
Attorney, Agent or Firm:
ENVISION PATENT & LAW FIRM (KR)
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