Title:
TESTING CONTROL SIGNALS IN A/D CONVERTERS
Document Type and Number:
WIPO Patent Application WO1998017003
Kind Code:
A3
Abstract:
The invention relates to an integrated circuit, containing an A/D converter and a test circuit, the latter in a test mode enabling explicit testing of analog and digital control signals of the circuit by supplying these control signals to circuit sections of the A/D converter and thus generating digital data signals at the output of the A/D converter. Analog signals, like bias signals and reference signals, can be selected and supplied to the input facility of the converter. Subsequently, a digital representation of the selected signal is obtained at the output facility of the converter. Digital signals, like clock signals, can be selected and supplied directly to the output facility. The output facility is operated by a clock signal and constructs a clocked version of the selected digital signal, which is subsequently available at the output. Thus, selected signals, either digital or analog, are available at the output of the converter and can be compared to specified data.
Inventors:
SACHDEV MANOJ
Application Number:
PCT/IB1997/001076
Publication Date:
June 25, 1998
Filing Date:
September 08, 1997
Export Citation:
Assignee:
PHILIPS ELECTRONICS NV (NL)
PHILIPS NORDEN AB (NL)
PHILIPS NORDEN AB (NL)
International Classes:
H03M1/10; H03M1/12; (IPC1-7): H03M1/10
Foreign References:
| US5305003A | 1994-04-19 | |||
| US4947168A | 1990-08-07 | |||
| US5132685A | 1992-07-21 |
Other References:
PROCEEDINGS OF 1995 IEEE INTERNATIONAL TEST CONFERENCE, October 1995, (Altoona, PA, USA), M. SACHDEV et al., "Industrial Relevance of Analog IFA: A Factor a Fiction", pages 61-70.
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