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Patent Searching and Data


Title:
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2018/135734
Kind Code:
A1
Abstract:
A three-dimensional shape measuring apparatus according to an embodiment of the present invention comprises: a flat measuring surface on which a measurement object is stably placed; a light source for irradiating light on the measurement object; a lens through which light irradiated from the light source is projected; and an image acquisition means for photographing an image reflected from the surface of the measurement object, wherein the lens and the image acquisition means are arranged so that a focus area on which an image is formed by the lens and the image acquisition means coincides with a surface on which the light is shaped.

Inventors:
LEE SANG YOON (KR)
KANG MIN GU (KR)
LEE HYUN MIN (KR)
SON JAI HO (KR)
Application Number:
PCT/KR2017/012695
Publication Date:
July 26, 2018
Filing Date:
November 09, 2017
Export Citation:
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Assignee:
INTEKPLUS CO LTD (KR)
International Classes:
G01B11/24
Foreign References:
JPH095048A1997-01-10
JPH08189817A1996-07-23
JPH09113234A1997-05-02
KR100672819B12007-01-22
JP2008191036A2008-08-21
Attorney, Agent or Firm:
SINJI PATENT FIRM (KR)
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