WIDE BAND TEST GRAB WIRE UNIT, WIDE BAND TEST GRAB WIRE BOARD AND WIDE BAND TEST DEVICE

Title:

WIDE BAND TEST GRAB WIRE UNIT, WIDE BAND TEST GRAB WIRE BOARD AND WIDE BAND TEST DEVICE

Document Type and Number:

WIPO Patent Application WO/2006/007790

Kind Code:

A1

Abstract:

The present invention discloses a wide band test grab wire unit, a wide band test grab wire board and a wide band test device. The said wide band test grab wire unit, comprises the first, second and third test end, signal separator (14), the first, second and third switch, and the first, second and third interface end; the said wide band test grab wire board, comprises at least two wide band test grab wire units and internal test bus groups, and the forth, fifth and sixth switch, the said internal test bus group comprises internal inter-test bus, internal extra-test bus and internal secondary test bus; the said wide band test device, comprises at least one wide band test grab wire board, the eighth and ninth switch, test control module, and the external inter-test bus and external extra-test bus, the said buses are connected with the said test control module; the said wide band test device in present invention has simple structure and low cost, and N+1 copy function can be implemented easily between the ends inside the board, the reliability of communication can be further increased.

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Inventors:

YAN ZHIGUO (CN)
XIAO RUIJIE (CN)
ZHOU JUN (CN)
YANG TAO (CN)

Application Number:

PCT/CN2005/001078

Publication Date:

January 26, 2006

Filing Date:

July 20, 2005

Export Citation:

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Assignee:

HUAWEI TECH CO LTD (CN)
YAN ZHIGUO (CN)
XIAO RUIJIE (CN)
ZHOU JUN (CN)
YANG TAO (CN)

International Classes:

H04B1/74; (IPC1-7): H04B1/74

Foreign References:

CN1283345A	2001-02-07
CN1398123A	2003-02-19

Other References: