Title:
ZQ CALIBRATION METHOD AND ZQ CALIBRATION CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2024/082566
Kind Code:
A1
Abstract:
A ZQ calibration method and a ZQ calibration circuit. When being applied to a wafer-level semiconductor chip, the ZQ calibration method comprises: after a target chip is powered on, recognizing whether the target chip has been set to be a master chip (S110); according to a recognition result of the target chip, selecting a corresponding calibration mode to perform ZQ calibration on the target chip (S120); switching, in a test mode, the setting of the target chip to be the master chip or a slave chip (S130); and executing calibration on the target chip again (S140).
Inventors:
LIU ZHIYANG (CN)
TIAN KAI (CN)
GU XUN (CN)
TIAN KAI (CN)
GU XUN (CN)
Application Number:
PCT/CN2023/086077
Publication Date:
April 25, 2024
Filing Date:
April 04, 2023
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/02; G11C7/10
Foreign References:
| CN112447213A | 2021-03-05 | |||
| CN114664220A | 2022-06-24 | |||
| US9767921B1 | 2017-09-19 | |||
| CN109390011A | 2019-02-26 | |||
| CN110036379A | 2019-07-19 | |||
| CN110770831A | 2020-02-07 | |||
| US20170109091A1 | 2017-04-20 | |||
| CN110534140A | 2019-12-03 | |||
| CN111009279A | 2020-04-14 | |||
| CN111581142A | 2020-08-25 | |||
| CN110993010A | 2020-04-10 | |||
| US20190096450A1 | 2019-03-28 |
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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