Title:
ANALYSIS DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM
Document Type and Number:
Japanese Patent JP2020149301
Kind Code:
A
Abstract:
To provide a technique for more accurately deriving the causal relation between mechanisms that reflects the actual condition of a production line.SOLUTION: An analysis device according to one side of the present invention acquires a plurality of pieces of measurement data on the state of a plurality of mechanisms that constitute a production line and premise information, statistically analyzes the plurality of pieces of measurement data under a constraint condition given by the premise information to specify the causal relation between the plurality of mechanisms, outputs causal relation information indicating the specified causal relation, accepts correction on the causal relation indicated by the output causal relation information, corrects the premise information to give a constraint condition fitting to the corrected causal relation, and stores the corrected premise information.SELECTED DRAWING: Figure 1
Inventors:
HATTORI REIKO
OTA YUYA
OTA YUYA
Application Number:
JP2019045743A
Publication Date:
September 17, 2020
Filing Date:
March 13, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G05B19/418
Domestic Patent References:
| JP2018206362A | 2018-12-27 | |||
| JP2008084039A | 2008-04-10 | |||
| JP2019028929A | 2019-02-21 |
Attorney, Agent or Firm:
Tachibana Kenji
Yamashita Unknown
Tsuyoshi Masuda
Yamashita Unknown
Tsuyoshi Masuda