複数のマッハツェンダー干渉計を有する光変調器の特性評価方法

Title:

複数のマッハツェンダー干渉計を有する光変調器の特性評価方法

Document Type and Number:

Japanese Patent JP5622154

Kind Code:

B2

Abstract:

A method for evaluating a characteristic of, especially, each of Mach-Zehnder interferometers (MZIs) of an optical modulator. The method includes a step of measuring the intensity of the output of the optical modulator containing MZIs and a step of evaluating a characteristic of each MZI by using the sideband. The output intensity measuring step is the one of measuring the intensity S n,k of the sideband signal contained in the output light from the optical modulator. The characteristic evaluating step is the one of evaluating a characteristic of the MZI k by using the S n,k .

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Inventors:

川西哲也
千葉明人
市川潤一郎
須藤正明

Application Number:

JP2011529707A

Publication Date:

November 12, 2014

Filing Date:

September 07, 2009

Export Citation:

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Assignee:

独立行政法人情報通信研究機構
住友大阪セメント株式会社

International Classes:

G01M11/00; G02F1/035

Foreign References:

WO2009110039A1	2009-09-11
WO2009110039A1	2009-09-11

Other References:

JPN6009050919; 川西哲也　外５名: '変調光スペクトルによるマッハツェンダー変調器の詳細特性測定' 電子情報通信学会技術研究報告Ｖｏｌ．１０８　Ｎｏ．２６１, 20081016, ｐｐ．５３-５８, 社団法人電子情報通信学会

Attorney, Agent or Firm:

Takayuki Hirose
Seki Daisuke
Notsu 10, 000 pears

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