質量分析計内の四重極からのＲＦ電圧を測定するための装置 - DA Technologies Development Private Limited

Title:

質量分析計内の四重極からのＲＦ電圧を測定するための装置

Document Type and Number:

Japanese Patent JP5831944

Kind Code:

B2

More Like This:

JP4173208	Mass scanning method used for ion trap mass spectrometer
JP7168542	Power module and mass spectrometer
WO/2017/039133	QUADRUPOLE MASS FILTER FOR MASS SPECTROMETER AND QUADRUPOLE MASS SPECTROMETER INCLUDING SAME

Inventors:

Bandar May, John

Application Number:

JP2012532430A

Publication Date:

December 09, 2015

Filing Date:

October 07, 2010

Export Citation:

Assignee:

DA Technologies Development Private Limited

International Classes:

H01J49/42

Domestic Patent References:

Attorney, Agent or Firm:

Hidesaku Yamamoto
Takaaki Yasumura
Natsuki Morishita

Previous Patent: 介護食事用注射器

Next Patent: PREPARATION OF BAGGED CORN SILAGE