Title:
廃棄物測定装置および廃棄物測定方法
Document Type and Number:
Japanese Patent JP6674836
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a waste measuring device capable of evaluating radioactive concentrations with high accuracy in a short time even when the radioactivity concentrations are distributed or eccentrically located in a radioactive waste in a vessel.SOLUTION: A space dose rate distribution measuring device 3 measures a space dose rate distribution of a radioactive waste 1 before stored in a radioactive waste container 5, and a dose rate distribution analysis/display device 10 creates space dose rate distribution information on the radioactive waste 1. A concentration distribution high speed condition generating device 11 converts the space dose rate distribution information to radioactivity distribution information or radioactivity concentration distribution information, and generates a concentration distribution constraint. A radioactive waste container 5 stores the radioactive waste 1 after the space dose rate distribution is measured. After then, a gamma ray spectrum measuring device 4 measures a gamma ray energy spectrum 120 against the radioactive waste 1 stored in the radioactive waste container 5, an in-container radioactive concentration evaluating device 13 evaluates the radioactive concentration of the radioactive waste 1 in the radioactive waste container 5, and an evaluation result display device 14 displays an evaluation result.SELECTED DRAWING: Figure 1
Inventors:
Yasushi Nagumo
Takahiro Tadokoro
Yuichiro Ueno
Ueno Katsunori
Koichi Okada
Shuichi Hatakeyama
Takahiro Tadokoro
Yuichiro Ueno
Ueno Katsunori
Koichi Okada
Shuichi Hatakeyama
Application Number:
JP2016089303A
Publication Date:
April 01, 2020
Filing Date:
April 27, 2016
Export Citation:
Assignee:
Hitachi ge Nuclear Energy Co., Ltd.
International Classes:
G01T1/167; G01T1/00; G01T1/203; G01T1/36
Domestic Patent References:
| JP2015219046A | ||||
| JP2015068677A |
Foreign References:
| US20020163988 |
Attorney, Agent or Firm:
Kaichi International Patent Office