Title:
【発明の名称】干渉計及びフーリエ変換分光計
Document Type and Number:
Japanese Patent JPH10500769
Kind Code:
A
Abstract:
An interferometer includes a beam splitter (BS) and two scanning mirrors (M1, M2), which are parallel and disposed on a common slide member that can be linearly displaced. The interferometer further comprises two compensating mirrors (M3, M4), which are disposed between the beam splitter (BS) and the scanning mirrors (M1, M2). The beam splitter (BS) and each of the compensating mirrors (M3, M4) are orthogonal. The interferometer has good tolerance for displacement inaccuracies of the scanning mirrors (M1, M2). The interferometer may be used for producing a compact and inexpensive Fourier transform spectrometer.
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Inventors:
Larson, Kai
Application Number:
JP52340595A
Publication Date:
January 20, 1998
Filing Date:
March 09, 1995
Export Citation:
Assignee:
Opsis AB
International Classes:
G01B9/02; G01J3/45; G01J3/453; (IPC1-7): G01J3/45; G01B9/02
Attorney, Agent or Firm:
Takehiko Suzue (4 outside)