Title:
ABNORMALITY DETECTOR
Document Type and Number:
Japanese Patent JP2014238068
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To verify whether an abnormality occurs to a mask process in a case of masking an abnormality detection process on a control target.SOLUTION: In an abnormality detector 10, a diagnostic status setting processing unit 23 sets a normal state as a diagnostic state if an abnormality detection unit 21 does not detect an abnormality in a control target, and sets an abnormal state as the diagnostic state if the abnormality detection unit 21 detects an abnormality in the control target. If a mask processing unit 22 masks a detection process performed by the abnormality detection unit 21, the diagnostic status setting processing unit 23 sets an undetected state as the diagnostic status. A mask abnormality determination processing unit 24 determines that an abnormality occurs to the mask processing unit 22 if a period for which the diagnostic status setting processing unit 23 sets the undetected state differs from a predetermined period.
Inventors:
FUJITA SHOHEI
Application Number:
JP2013121712A
Publication Date:
December 18, 2014
Filing Date:
June 10, 2013
Export Citation:
Assignee:
DENSO CORP
International Classes:
F02D45/00; F02D41/22
Domestic Patent References:
| JPH11261924A | 1999-09-24 | |||
| JP2011157856A | 2011-08-18 | |||
| JP2012127194A | 2012-07-05 | |||
| JP2007046546A | 2007-02-22 | |||
| JPH0942993A | 1997-02-14 | |||
| JPH11261924A | 1999-09-24 | |||
| JP2011157856A | 2011-08-18 | |||
| JP2012127194A | 2012-07-05 |
Foreign References:
| US20060119475A1 | 2006-06-08 | |||
| US20060119475A1 | 2006-06-08 |
Attorney, Agent or Firm:
Patent business corporation Satow international patent firm