To provide a burn-in test program simulation device, its method, and a storage medium for simulating a burn-in test program for executing a burn-in test on an IC without using any actual device or any IC to be tested so as to shorten the evaluation time.

In a PC 1 simulating the burn-in test program for executing the burn-in test on an IC, the burn-in test program and virtual IC to be tested data are stored in a storage part 13, the burn-in test, in which a virtual testing pattern signal is impressed to the virtual IC to be tested data stored in the storage part 13, is simulated by the virtual control part 11 on the basis of the burn-in test program stored in the storage part 13, and the simulation execution result of the burn-in test carried out by the virtual control part 11 is displayed as an IC image 12a in a display part 12.