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Title:
CIRCUIT SIMULATION METHOD, CIRCUIT SIMULATION PROGRAM, AND CIRCUIT SIMULATION DEVICE FOR EVALUATION OF DELAY CHARACTERISTIC
Document Type and Number:
Japanese Patent JP2006146595
Kind Code:
A
Abstract:

To provide a simulation method for conducting simulations while adequately approximating an output load, a related program, and a simulation device.

The simulation device has a model generation function 111 for dividing a logic circuit into a plurality of partial circuits; a selective function 112 for selecting from the plurality of partial circuits a circuit of interest and a load circuit connected to the post stage, in such a manner that each of the partial circuits becomes a circuit of interest at least once; a simplification function 113 for simplifying the load circuit by specifying a transistor driven via the output terminal of the circuit of interest, and connecting to the drain of the transistor a source of virtual control voltages that varies the output potential of the transistor according to the gate potential of the transistor; and a simulation function 114 for combining the circuit of interest with the simplified load circuit to conduct simulations to evaluate the delay characteristic of each of the selected circuits of interest.


Inventors:
ABE TAISUKE
Application Number:
JP2004336330A
Publication Date:
June 08, 2006
Filing Date:
November 19, 2004
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G06F17/50; H01L21/82
Attorney, Agent or Firm:
Hayashi Tsunetoku
Kenji Doi