Title:
DEFECT INSPECTION METHOD FOR METALLIC CAP, REGULATION METHOD FOR INSPECTION THEREOF, AND DEFECT INSPECTION METHOD FOR METALLIC CAP
Document Type and Number:
Japanese Patent JP2006300711
Kind Code:
A
Abstract:
To precisely detect a defect generated in a lower end edge of a metal cap.
A bottle can of an inspection object is illuminated from a diagonal upper side by a lighting part 2 of a ringlike light source, and an upper part of the bottle can including the cap is imaged over the full circumference by four cameras 1A, 1B, 1C, 1D. An image processor 3 reads images in from the respective cameras 1A, 1B, 1C, 1D, and sets an inspection area in a main part of each of the images to detect a shadow area. The bottle can is judged as a defective when the shadow area is detected in any of the images.
Inventors:
INAGAWA YASUHIKO
MAEDA TATSUMI
HAYASHI NORIHIRO
MAEDA TATSUMI
HAYASHI NORIHIRO
Application Number:
JP2005122376A
Publication Date:
November 02, 2006
Filing Date:
April 20, 2005
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01N21/90; B65B57/02; B67B3/26; G01B11/30
Domestic Patent References:
| JPS577505A | 1982-01-14 | |||
| JPH0843049A | 1996-02-16 | |||
| JP2004219399A | 2004-08-05 | |||
| JP2000131044A | 2000-05-12 | |||
| JPH02157610A | 1990-06-18 | |||
| JPH09304029A | 1997-11-28 |
Attorney, Agent or Firm:
Yumitsu Suzuki