Title:
DEVICE FOR DYNAMIC-MECHANICAL ANALYSIS OF SAMPLE
Document Type and Number:
Japanese Patent JP2001349822
Kind Code:
A
Abstract:
To provide a device for the dynamic-mechanical analysis of a sample, capable of utilizing a wide range of exciting frequency with high measuring accuracy.
An analyzer developed by improving the device for the dynamic- mechanical analysis of the sample is constituted of a sample holder (11), a regulator (13) and a carrier (1) for the whole of the analyzer. This analyzer can utilize a wide range of excitation frequency with high measuring accuracy.
Inventors:
BUCK REINHOLD
Application Number:
JP2001026192A
Publication Date:
December 21, 2001
Filing Date:
February 02, 2001
Export Citation:
Assignee:
METTLER TOLEDO AG
International Classes:
G01N19/00; G01N3/18; G01N3/38; (IPC1-7): G01N19/00
Attorney, Agent or Firm:
Masanori Ishihara (1 person outside)
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