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Title:
DUST MONITORING KIT AND EVALUATION METHOD USING THE SAME
Document Type and Number:
Japanese Patent JP2012208080
Kind Code:
A
Abstract:

To provide a dust collecting kit, when evaluating micro dust that is present in manufacturing environment, especially dust having such a size or more as naturally falling in air, being installed in a small clearance, facilitating the mounting, moving and handling after the collection, inexpensively accommodating to an increase in measuring sites and allowing a person to efficiently perform an observation of the collected dust and an analytical operation such as re-peeling.

A dust monitoring kit includes: a base material sheet 1; a plurality of adhesive sheets 3 superposed thereon, having a weak adhesion capable of sticking micro dust at a sufficient fixing force and at a re-peelable retaining force; and a non-adhesive protective sheet 7 provided to cover the adhesive sheets for retaining cleanness on the surface of the adhesive sheet layer 3. The dust monitoring kit is used for collecting the micro dust by peeling off the protective sheet 7.


Inventors:
NABEYA HIROMI
Application Number:
JP2011075618A
Publication Date:
October 25, 2012
Filing Date:
March 30, 2011
Export Citation:
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Assignee:
TOPPAN PRINTING CO LTD
International Classes:
G01N1/02; B32B27/00; C09J7/02
Domestic Patent References:
JPH01138285A1989-05-31
JPS6258735U1987-04-11
JP2005065624A2005-03-17
JPS6273244U1987-05-11
JPH11248655A1999-09-17
JPS5510U1980-01-05
JP2005009919A2005-01-13
JPH07509779A1995-10-26
JP2003035654A2003-02-07
JP2009036716A2009-02-19
Foreign References:
US5356751A1994-10-18
Attorney, Agent or Firm:
Kurata Masatoshi
Takakura Shigeo
Satoshi Kono
Makoto Nakamura
Yoshihiro Fukuhara
Takashi Mine
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Kocho Chojiro
Naoki Kono
Katsu Sunagawa
Morisezo Iseki
Tatsushi Sato
Takashi Okada
Mihoko Horiuchi
Takenori Masanori