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Title:
EDDY CURRENT FLAW INSPECTING INSTRUMENT
Document Type and Number:
Japanese Patent JP2002277443
Kind Code:
A
Abstract:

To provide an eddy current flaw inspecting instrument which can improve the reliability of inspection by enabling clarifying of signals of defect sites distinguished from end part signals even when defects exist near axial ends of parts to be inspected of an inspection object.

An eddy current detector 8 in which a plurality of eddy current sensors are arranged on a sensor block 7 where a passing opening 16 copying the shape of the outer circumference of the part 2 to be inspected is formed is arranged so as to be movable relatively in the axial direction thereof between it and the inspection object 3 while with a controller 4 connected to the eddy current detector 8, superior inspection data obtained by the axial relative movement between the eddy current detector 8 and a superior inspection object without defect are previously stored. A difference is determined with a subtracter 9 between the superior inspection data and the inspection data obtained by the axial relative movement between the eddy current detector 8 and the inspection object 3 thereby extracting signals alone of the defect sites at the parts 2 to be inspected of the inspection object 3.


Inventors:
MAENO JUN
SUZUKI TOSHIAKI
FUJIWARA MITSUGI
MIYAMURA TADANOBU
Application Number:
JP2001078427A
Publication Date:
September 25, 2002
Filing Date:
March 19, 2001
Export Citation:
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Assignee:
ISHIKAWAJIMA INSPECTION & INST
International Classes:
G01N27/90; (IPC1-7): G01N27/90
Attorney, Agent or Firm:
Tsunemitsu Yamada (1 person outside)