Title:
ELECTROMAGNETIC NOISE MEASURING METHOD AND ELECTROMAGNETIC NOISE MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2022168597
Kind Code:
A
Abstract:
To provide an electromagnetic noise measuring method and an electromagnetic noise measuring device which can accurately identify a noise source.SOLUTION: This electromagnetic noise measuring method executes a step of executing a far-field measurement in the vicinity of a target device to measure an electromagnetic noise in the vicinity of the target device via a first port of a measurement probe at first timing, and storing the measured data therefrom in a memory. Thereafter, this electromagnetic noise measuring method repeatedly executes while changing measurement places: a step of executing a near-field measurement of measuring an electromagnetic noise in the vicinity of a candidate of a noise source that gives the electromagnetic noise to the target device in the vicinity of the candidate of the noise source via the first port at second timing later than the first timing; and a step of calculating a noise source matching index which is a numeric value indicating the degree of approximation between the far-field measurement and the near-field measurement.SELECTED DRAWING: Figure 1
Inventors:
PAOLETTI UMBERETO
Application Number:
JP2021074172A
Publication Date:
November 08, 2022
Filing Date:
April 26, 2021
Export Citation:
Assignee:
HITACHI LTD
International Classes:
G01R29/08
Attorney, Agent or Firm:
Patent Attorney Corporation Hiraki International Patent Office
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