Title:
例外処理テスト装置及び方法
Document Type and Number:
Japanese Patent JP5528640
Kind Code:
B2
Abstract:
The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.
More Like This:
| JPS62173541 | CONTROL SYSTEM FOR BREAK POINT |
| JPH03144832 | SYMBOLIC DEBUGGING DEVICE FOR PRECOMPILER LANGUAGE PROGRAM |
| JP2014203165 | DEBUGGING DEVICE |
Inventors:
Choe, Byung-ju
Seo, Ju Young
Yang, Sun-One
Kim, Yung-Soo
Oh, John-Suk
Kwon, Haeyoung
Seung-young, Jean
Seo, Ju Young
Yang, Sun-One
Kim, Yung-Soo
Oh, John-Suk
Kwon, Haeyoung
Seung-young, Jean
Application Number:
JP2013538617A
Publication Date:
June 25, 2014
Filing Date:
May 09, 2011
Export Citation:
Assignee:
Hyundai Motor Company
Kia Motors Corporation
Ifa University-Industry Collaboration Foundation
Kia Motors Corporation
Ifa University-Industry Collaboration Foundation
International Classes:
G06F11/28
Domestic Patent References:
| JP10133914A | ||||
| JP2009104490A | ||||
| JP2010224795A |
Attorney, Agent or Firm:
Kyosei International Patent Office