Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
EXPOSURE METHOD AND EXPOSURE DEVICE
Document Type and Number:
Japanese Patent JP2008091793
Kind Code:
A
Abstract:

To provide an exposure method and an exposure device, capable of locally optimizing such factors as incident angle, polarizing direction, and exposure amount, according to places in a sample when patterning the solid sample having a rough on its surface.

When a solid sample 1 having a rough on its surface is subjected to a lithography processing, the incident light 2 is inclined within the range of 10 to 60 relative to the normal direction of a substrate surface of the solid sample 1 for exposure, in an exposure process in which a resist is applied for patterning. Here, the amount of exposure may be varied partially depending on the place in the solid sample 1. The incident light 2 whose polarizing direction 4 is controlled may be used.


Inventors:
SASAKI MINORU
HANE KAZUHIRO
HAYASHI HIROKI
Application Number:
JP2006273326A
Publication Date:
April 17, 2008
Filing Date:
October 04, 2006
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
UNIV TOHOKU
USHIO ELECTRIC INC
International Classes:
H01L21/027; G03F7/20
Domestic Patent References:
JPH06291018A1994-10-18
JPH0269604A1990-03-08
JP2003163150A2003-06-06
JP2000058786A2000-02-25
JPS4432754B1
JPS56133873A1981-10-20
JPS56114326A1981-09-08
JPH10154658A1998-06-09
JP2000122302A2000-04-28
JPH10270320A1998-10-09
JP2004513528A2004-04-30
JPH05226226A1993-09-03
Foreign References:
WO1999008314A11999-02-18
Attorney, Agent or Firm:
Atsushi Suda
Shuji Kusunoki