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Title:
FINE-PARTICULATE ANALYZER
Document Type and Number:
Japanese Patent JP2005214931
Kind Code:
A
Abstract:

To provide a fine-particulate analyzer capable of measuring a particle size distribution of fine particulates having a wide distribution from a nano-meter size to a submicron size suspended in a gas phase, and the change along with a lapse of time in a number concentration about the specified particle size of fine particulate while classifying in two kinds of particle size ranges, at the same time and in a real time.

In this fine-particulate analyzer, the first measuring area 2 is formed between a common electrode part 4 and the center electrode 5, in a differential type electric mobility measuring instrument 1, the second measuring area 3 is formed between the common electrode part 4 and a conductive sleeve 20, the charged fine particulates are led into a sample gas introducing hole 27 through a sample gas introducing tube 26, one portion thereof is taken in the first measuring area 2 via a sample gas introducing slit 10, the remainder thereof is taken in the second measuring area 3 from a sample gas introducing flow passage 31, and the taken-in charged particulates are classified under respective measuring conditions.


Inventors:
TAKEUCHI KAZUO
OKADA YOSHIKI
YABUGEN JIYUNSUKE
Application Number:
JP2004025586A
Publication Date:
August 11, 2005
Filing Date:
February 02, 2004
Export Citation:
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Assignee:
WYCKOFF KAGAKU KK
International Classes:
G01N27/60; B03C7/02; G01N15/02; (IPC1-7): G01N15/02; B03C7/02; G01N27/60
Attorney, Agent or Firm:
Kenji Yoshitake
Hiroyuki Nagai
Junpei Okada
Hirohito Katsunuma
Kiyohiro Suzuki