Title:
FREQUENCY CHARACTERISTIC MEASURING DEVICE
Document Type and Number:
Japanese Patent JP3140234
Kind Code:
B2
Abstract:
PURPOSE: To provide a frequency characteristic measuring device which is excellent in the working efficiency and has reliable measuring accuracy.
CONSTITUTION: An interface 3 encloses a correcting jig 12. An operation mode and a measuring mode are selected by operating an operation box 5. A control part 6 of the interface 3 switches switch groups Sa and Sb of a switch part 7 to/from each other according to the measuring mode. A control part 8 of a spectrum analyzer 1 starts measurement according to the operation mode, and stores a measured result of normal measurement in a measuring storage part 10, and after a measured result of correcting measurement is stored in a correcting storage part 11, picture processing is carried out on these measured results by a CRT 9. Particularly after the normal measurement is finished, when a frequency characteristic of a material 13 to be measured coincides with a reference, a user is informed of a fact of being excellent goods by lighting a light emitting diode 2a in a tracking generator 2, and when it cannot coincide with the reference, the user is informed of a fact of being inferior goods by lighting a light emitting diode 2b.
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Inventors:
Yoshihiro Shimatani
Application Number:
JP1444293A
Publication Date:
March 05, 2001
Filing Date:
February 01, 1993
Export Citation:
Assignee:
Sharp Corporation
International Classes:
G01R27/28; G01R23/173; G01R35/00; (IPC1-7): G01R27/28; G01R23/173; G01R35/00
Domestic Patent References:
| JP611540A | ||||
| JP4249776A | ||||
| JP5934171A |
Attorney, Agent or Firm:
Shizuo Sano