Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
INSPECTING DEVICE FOR SUBSTRATE
Document Type and Number:
Japanese Patent JPS589009
Kind Code:
A
Abstract:

PURPOSE: To decide arbitrary patterns automatically and accurately by processing the image information read by an image sensor with a microcomputer.

CONSTITUTION: In a sensor part 100, the patterns on a substrate 1 are made into image information by means of a sensor 2 driven by a driving circuit 3 and a roller 7 driven by a motor 6 and this information is read into a CPU5 via an AD converter 4. The original picture which is read first is stored in a hard disc 12, and the position reference and inspection area of the original picture are assigned by the operation of a master CPU9. While viewing a part of the specimen on a display 14, the operator enlarges said patterns with a slave system 500 and erases pinholes α and pattern cuts β, then the patterns are reduced and the defective parts are detected by arithmetic operations.


Inventors:
SUGIE HIROSHI
ARAI TOORU
TAKAHASHI OSAMU
Application Number:
JP10787181A
Publication Date:
January 19, 1983
Filing Date:
July 10, 1981
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01R31/02; G01B11/24; G06K9/36; G06T1/00; (IPC1-7): G01B11/24; G01R31/02; G06K9/36
Attorney, Agent or Firm:
Shinichi Kusano