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Title:
INSPECTION METHOD, AND INSPECTION DEVICE FOR SURFACE SHAPE
Document Type and Number:
Japanese Patent JP2005345383
Kind Code:
A
Abstract:

To provide an inspection method and an inspection device capable of accurately inspecting characteristics of a surface shape by eliminating effects of a rear face reflected image by an inexpensive device configuration.

A stripe pattern 1 having light and shade patterns set such that a reflected image by a surface of a transparent tabular body and a reflected image by a rear face of the transparent tabular body are separated in an image signal acquired by imaging is determined as a stripe pattern suiting the transparent tabular body 3 (an object to be inspected). The surface shape of the transparent tabular body 3 is evaluated by image analysis using the determined stripe pattern 1 and only the reflected image by the surface of the transparent tabular body 3 of the stripe pattern 1.


Inventors:
SONDA YOSHIYUKI
OOTO HITOAKI
KATO MUNEHISA
SHIROYAMA ATSUSHI
Application Number:
JP2004167621A
Publication Date:
December 15, 2005
Filing Date:
June 04, 2004
Export Citation:
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Assignee:
ASAHI GLASS CO LTD
International Classes:
G01B11/24; G01B11/25; G01N21/896; G01N21/95; (IPC1-7): G01B11/24; G01B11/25
Domestic Patent References:
JP2004514882A2004-05-20
JP2001502800A2001-02-27
Attorney, Agent or Firm:
Rock wall Fuyuki
Makoto Shiokawa