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Title:
イオン化方法、イオン化装置、及び質量分析装置
Document Type and Number:
Japanese Patent JP7171016
Kind Code:
B2
Abstract:
To provide an ionization method which can make the structure of an ionizer simpler than a conventional method and enables the downsizing thereof.SOLUTION: A method for ionizing a gaseous sample comprises the steps of: (A) evacuating an ionization chamber with a plasma discharge unit and introducing a sample and the air; and (B) regulating a pressure in the ionization chamber and generating plasma by the plasma discharge unit. In the step (B), [M](M represents a measured sample molecule) ions resulting from ionization of the sample, and [nM+K]ions (n is 1 or 2, and K is an added ion originating from an air component) with an air component-originating ion added thereto are produced by the generated plasma; the pressure of the ionization chamber is set so that a signal intensity of the [nM+K]ions becomes larger than that of the [M]ions.SELECTED DRAWING: Figure 4

Inventors:
Yoko Nunome
Kenji Kodama
Application Number:
JP2018095288A
Publication Date:
November 15, 2022
Filing Date:
May 17, 2018
Export Citation:
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Assignee:
Hiroshima University
International Classes:
H01J49/10; G01N27/62
Domestic Patent References:
JP2006523367A
JP2011522211A
Foreign References:
WO2011089912A1
KR1020100021161A
WO2009132604A2
Attorney, Agent or Firm:
Patent Attorney Corporation Maeda Patent Office