PURPOSE: To judge the normality and abnormality of dislocation of an upper and a lower electrodes in a short time securely and easily and independently of the skillfulness of an inspector by forming marks for the inspection of relative dislocation of an upper and a lower electrode patterns into the same pattern with the ordinary display pattern.
CONSTITUTION: Inspection marks 1, 2 are formed into the shape for generating an overlap of the inspection mark 1 to be connected to a segment electrode terminal and the inspection mark 2 to be connected to a common electrode in the case where dislocation of an upper and a lower electrode patterns exceed predetermined values X, Y. With this structure, liquid crystal at an overlapped part can be lighted when voltage is applied to the mark 1 connected to the segment electrode terminal and the mark 2 connected to the common electrode. A judgement that the quantity of dislocation exceeds a predetermined value or not is performed by observing the lighting condition of the marks 1, 2. At this stage, in the case where the marks 1, 2 are not lighted, quantity of the dislocation is judged smaller than X, Y, and in the case where the marks 1, 2 are lighted, quantity of the dislocation is judged larger than X, Y.
TAKAHASHI HISAO
KAMOI SUMIO
TANAKA MASAKI
IKEGUCHI HIROSHI
