Title:
LIQUID CRYSTAL DISPLAY DEVICE TEST METHOD, AND LIQUID CRYSTAL DISPLAY DEVICE
Document Type and Number:
Japanese Patent JP3912856
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To prevent a display defect of a liquid crystal display device due to static electricity and to perform a simple collective image test.
SOLUTION: When plural gate wiring 2 and plural source wiring 3 arranged intersecting each other on this device, and plural thin film transistors 5 and display electrodes 6 are arranged in a matrix on respective intersections between both wiring 2, 3, and a counter substrate 7 is provided holding a liquid crystal layer therebetween, the gate wiring 2 and source wiring 3 are made low resistance by connecting through parallel wiring 17 short-circuited by plural pieces of high resistance wiring material. Thus, the static electricity is prevented by the high resistance wiring, and further, the gate wiring 2 and source wiring 3 are short-circuited by the low resistance, and an excellent display test is obtained.
Inventors:
Tatsuya Wakimoto
Eiji Yamamoto
Eiji Yamamoto
Application Number:
JP19243497A
Publication Date:
May 09, 2007
Filing Date:
July 17, 1997
Export Citation:
Assignee:
Toshiba Matsushita Display Technology Co., Ltd.
International Classes:
G01R31/00; G02F1/13; G02F1/1343; G02F1/136; G02F1/1368; H01L29/786; (IPC1-7): G02F1/13; G01R31/00; G02F1/1343; G02F1/136; H01L29/786
Domestic Patent References:
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Foreign References:
| WO1997005654A1 | ||||
| WO1997006465A1 |
Attorney, Agent or Firm:
Mitsutake Murayama
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