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Title:
MAGNETIC PARTICLE INSPECTION METHOD AND MAGNETIC PARTICLE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP3614419
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a magnetic particle inspection method and a magnetic particle inspection device capable of detecting a flaw at a low cost in a short time without requiring skill and troublesome work, and improving the detection performance of a fine defect.
SOLUTION: At least a magnetic sheet 19 in contact with the face side of a flaw detection material is formed of a transparent material, and by partitioning the space between the sheet on the face side in contact with the flaw detection material and a sheet on the opposite face side, into many small chambers 22 and dispersing magnetic particles 24 coated with a luminescent paint in dispersant 23 in the small chambers 22 is brought into contact with the test surface of the flaw detection material or pushed thereon to be adhered thereto. Then, the magnetic sheet 19 is separated from the flaw detection material, and the magnetic sheet 19 is irradiated with visible light or an ultraviolet ray 25, to allow to emit light from a magnetic particle pattern drawn on the magnetic sheet 19.


Inventors:
Toshio Hasegawa
Hideyuki Hirasawa
Mitsuhiro Kamioka
Sakai Kuniyoshi
Matsui
Application Number:
JP2002340701A
Publication Date:
January 26, 2005
Filing Date:
October 24, 2000
Export Citation:
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Assignee:
Kawasaki Heavy Industries, Ltd.
International Classes:
G01N27/84; G01N27/85; (IPC1-7): G01N27/85; G01N27/84
Domestic Patent References:
JP6076877U
JP49078511U
JP3040339B2
JP56005934B1
JP5264511A
JP6098373A
JP56040752A
JP57026742A
JP2001021539A
JP2002090343A
JP2002090344A
JP2002116188A
Attorney, Agent or Firm:
Yoshihiro Tsunoda
Yasu Furukawa
Toshio Nishitani
Keiji width