Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD, INSTRUMENT, AND PROGRAM FOR STRESS MEASUREMENT
Document Type and Number:
Japanese Patent JP2005233732
Kind Code:
A
Abstract:

To provide a method for stress measurement applied even to a minute, brittle, and/or very little specimen.

This instrument for measuring stress acting on a specimen under test, is equipped with: a spectrum measuring part for measuring a spectroscopic spectrum at a region under test of the specimen; a storage part for previously therein storing data including at least the stress sensitivity coefficient of the specimen; an arithmetic part for performing arithmetic processing comprising a step for calculating the peak shift amount of the spectrum caused by stress from the spectroscopic spectrum of the specimen and a step for calculating stress acting on the specimen from the shift amount and from the sensitivity coefficient according to a stress calculation algorithm; and an output part for outputting a calculated stress value. The sensitivity coefficient is derived from a relation between stress distribution in the vicinity of an end of a crack in a standard specimen having the crack and a peak shift amount in the spectroscopic spectrum of the standard specimen caused by stress and measured in the vicinity of the end of the crack.


Inventors:
HOSOKAWA TEPPEI
YABUUCHI YASUFUMI
MENYA KAZUNORI
TSUKAMOTO YOSHIRO
PETTSUOTTEI JUSEPPE
Application Number:
JP2004042068A
Publication Date:
September 02, 2005
Filing Date:
February 18, 2004
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01L1/00; (IPC1-7): G01L1/00
Attorney, Agent or Firm:
Shiro Ogasawara