To provide a method which makes both ITP and JTAG boundary scanning usable on a system, without involving a user or modifying hardware or software.
This is a method(200)for making plural testing devices operational within the system. The method(200) includes a step(202) for deciding, if a first testing device or a second testing device is connected to the system. When the first testing device is connected to the system, this method includes the step of making the first testing device operatable with an interface(320) for the system, in which the first testing device can be connected to an object device to be tested. When the second testing device is connected to the system, this method includes the step of making the second testing device operational together with the above interface.
JP4148677 | Dynamic burn-in device |
JPWO2012137340 | Test method and semiconductor integrated circuit to which the test method is applied |
JPH03180774 | CIRCUIT VERIFYING DEVICE |
BARR ANDREW H
CHANG JACKY TSUN-YAO
Takahiko Mizobe
Kiyoharu Nishiyama