MICROCONTROLLER TYPE INTEGRATED CIRCUIT EQUIPPED WITH STATIC MEMORY STORING PARTICULARLY COMPREHENSIVE PROGRAM FOR TEST, TEST STATION, AND CORRESPONDING MANUFACTURE

Title:

MICROCONTROLLER TYPE INTEGRATED CIRCUIT EQUIPPED WITH STATIC MEMORY STORING PARTICULARLY COMPREHENSIVE PROGRAM FOR TEST, TEST STATION, AND CORRESPONDING MANUFACTURE

Document Type and Number:

Japanese Patent JPH07151832

Kind Code:

A

Abstract:

PURPOSE: To make it possible to test, rapidly and simply, functional property of a peripherally structured system, by including a comprehensive test program in a masked ROM and by giving this program a function to write into data storing/processing elements.

CONSTITUTION: A microcontroller 11 has a masked ROM 14, which includes a comprehensive test program and the like, and a microcontroller system 12, which enables the controller 11 to function, has data storing/processing elements 16 to 110. The test program included in the ROM 14 reads data stored in a static memory 16, a dynamic memory 17 and the like, and writes data into the memory 17 and the like. And a program written in one of the elements including the memory 17 is executed. Efficacy of respective elements composing the system 12 can be thereby tested irrespetively of application programs. Further, a remote-loading program can be loaded in the memory 17 by changing an application program.

Inventors:

JIYANNPIEERU BARUBINO

Application Number:

JP16160794A

Publication Date:

June 16, 1995

Filing Date:

July 13, 1994

Export Citation:

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Assignee:

ALCATEL MOBILE COMM FRANCE

International Classes:

G06F11/273; H01L21/66; G01R31/28; (IPC1-7): G01R31/28; H01L21/66

Attorney, Agent or Firm:

Yoshio Kawaguchi (2 outside)

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