Title:
METHOD AND DEVICE FOR INSPECTING PROBE FOR INSPECTING EGG AND FOR INSPECTING EGG
Document Type and Number:
Japanese Patent JP3038146
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain a probe for inspecting an egg for retaining an excitation member for inspecting the egg by magnetic field and a method and device for inspecting the egg.
SOLUTION: A probe 30 for a device 1 for inspecting an egg is constituted of a probe pipe 31 with an annular magnet 34 arranged at a bottom edge 32, an annular excitation member 50 is magnetically retained by the annular magnet 34 within the probe pipe 31, the probe 30 can be moved in the direction of an axial line in a metal pipe 11 where a bobbin 14 is wound around, the probe 30 is retained between the metal pipe 11 and the annular magnet 34 by magnetic attraction force at a pause position, the probe 30 is moved to an operating position by an excitation pulse supplied to the bobbin 14, and the pulse can be supplied by a control device by considering the diameter of an egg to be inspected and a carrier speed (v) of a conveyor.
Inventors:
Moaieri Hossain
Application Number:
JP9810296A
Publication Date:
May 08, 2000
Filing Date:
April 19, 1996
Export Citation:
Assignee:
FPS Foods Processing Systems Bethroten Fennaught Shap
International Classes:
A01K43/00; A01K43/06; G01N29/04; G01N29/12; G01N33/08; (IPC1-7): G01N29/12; G01N33/08
Domestic Patent References:
| JP6472030A | ||||
| JP59151007A | ||||
| JP479198A |
Other References:
【文献】欧州公開602285(EP,A1)
Attorney, Agent or Firm:
Hideo Dobashi (1 outside)