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Title:
PARAMETER CREATION METHOD OF LARGE SIGNAL EQUIVALENT CIRCUIT MODEL OF FIELD-EFFECT TRANSISTOR USING GALLIUM ARSENIDE, SIMULATION METHOD USING THE PARAMETER CREATION METHOD, PROGRAM FOR EXECUTING THE METHODS BY COMPUTER, AND PROGRAM-RECORDED RECORDING MEDIUM
Document Type and Number:
Japanese Patent JP2003069037
Kind Code:
A
Abstract:

To obtain a parameter creation method of a large signal equivalent circuit model of a relatively simple GaAs FET, which can show characteristics such as PHEMT accurately even if a bias voltage is changed, and to provide a simulation method of a circuit that performs large signal operation using the PHEMT.

For the parameter creation method of the large signal equivalent circuit model of a GaAs FET, in a variable V1 of a numerical expression for indicating a drain current Ids of a Curtis Etenberg model that is the large signal equivalent circuit model for expressing the electric characteristics of FETs, a numerical expression is applied. In the numerical expression, the term of a gate voltage is not applied to the value of δ that is a correction term of Ids-Vgs characteristics in the case of a value that differs from Vds when parameters are extracted.


Inventors:
SEKINE TOMOTSUGU
KAWAKAMI KENJI
Application Number:
JP2001256013A
Publication Date:
March 07, 2003
Filing Date:
August 27, 2001
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G06F17/50; H01L29/00; H01L29/80; (IPC1-7): H01L29/80; G06F17/50; H01L29/00
Attorney, Agent or Firm:
Kaneo Miyata (1 person outside)