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Title:
PCB ANALYSIS METHOD, PCB ANALYSIS SAMPLE INLET DEVICE, AND PCB ANALYZER
Document Type and Number:
Japanese Patent JP2007093440
Kind Code:
A
Abstract:

To provide a PCB analysis method, which is a method for analyzing a sample containing PCB using capillary gaschromatograph, capable of quickly and accurately detecting/quantifying the PCB, with very low contamination of the separation column or the detector, and to provide a PCB analyzer used for the method.

The temperature of a gasifying part of a sample inlet device is made lower than the gasification temperature of the solvent of the sample. After the sample is injected, the temperature is increased, until the gasification of the PCB in the sample. After it is kept for the time required for gasification of the PCB, the temperature is decreased below the gasification temperature of the solvent of the sample, and the contamination components in the sample are kept remaining in the gasification part. This PCB analyzer comprises at least the PCB analysis sample inlet device used for the PCB analysis method, the capillary column chromatograph equipped with the PCB analysis sample inlet device, and the detector.


Inventors:
OMURA NAOYA
TAKEI YOSHIYUKI
Application Number:
JP2005284486A
Publication Date:
April 12, 2007
Filing Date:
September 29, 2005
Export Citation:
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Assignee:
CENTRAL RES INST ELECT
GL SCIENCES INC
International Classes:
G01N30/88; B01J20/281; B01J20/285; G01N27/62; G01N30/00; G01N30/06; G01N30/12; G01N30/16; G01N30/60; G01N30/72; G01N30/86; G01N30/54
Domestic Patent References:
JPH0943214A1997-02-14
JPS5862248A1983-04-13
JPH09325140A1997-12-16
JP2000088825A2000-03-31
Foreign References:
WO2006077912A12006-07-27
Attorney, Agent or Firm:
Koichi Hirota
Yoshihiro Nagare
Naoko Matsuda