To provide a probe used in a scanning tunneling microscope with an extremely sharp tip and high strength and its manufacturing method.

In the probe 10 of the scanning tunneling microscope and its manufacturing method, the probe 10 is formed from metal such as tungsten, a tip surface 12 of the probe 10 has a buffer layer such as a carbonization coating film, and a carbon nanotube 13 is extended from the buffer layer such as the carbonization coating film of the tip surface 12 of the probe 10.