Title:
PROBE STRUCTURE AND PROBE CARD DEVICE
Document Type and Number:
Japanese Patent JP2022169422
Kind Code:
A
Abstract:
To provide a probe card device including a probe structure.SOLUTION: Probes S respectively pass through multiple through holes C1, C2 on at least two guide plates P1, P2 that are stacked and separated from each other. Each of the probes includes a main body 1, a contacting portion 2, a head portion 3, and a neck portion 4. The neck portion 4 is arranged between the main body 1 and the head portion 3 and exposed above the uppermost guide plate P1. A part of the neck portion 4 protrudes toward the main body 1 and the head portion 3 to form a protrusion portion 41. The protrusion portion 41 and the main body form a predetermined angle. The protrusion portion 41 abuts against an upper surface of the uppermost guide plate P1. The protrusion portion 41 has a thickness. A spacing between adjacent two probes 1 is less than twice the thickness of the protrusion portion 41.SELECTED DRAWING: Figure 5
Inventors:
LOU CHOON LEONG
Application Number:
JP2021171702A
Publication Date:
November 09, 2022
Filing Date:
October 20, 2021
Export Citation:
Assignee:
TECAT TECH SUZHOU LTD
International Classes:
G01R1/073; G01R1/067
Domestic Patent References:
| JP2019525204A | 2019-09-05 |
Foreign References:
| US20100231249A1 | 2010-09-16 |
Attorney, Agent or Firm:
Shigeru Kinoshita