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Title:
PROBE TIP GENERATING METHOD FOR NANOSTRUCTURE AND ITS GENERATING DEVICE
Document Type and Number:
Japanese Patent JP3756469
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a probe tip generating method for a nanostructure and its generating device which generates a microscopic probe tip part and controls its growth direction.
SOLUTION: This device is provided with: a chamber 1; a probe heating means 7; a setting means of a catalyst; an electric field application means 8 applying an electric field between the catalyst 3 and a probe 5; and a cantilever moving means 6. Diffusion of a catalyst material to the probe tip is generated by contacting the probe made in advance with the catalyst and keeping them at a high temperature to grow a carbon nanotube and/or a whisker-like silicon crystal.


Inventors:
Hideki Kawakatsu
Application Number:
JP2002186030A
Publication Date:
March 15, 2006
Filing Date:
June 26, 2002
Export Citation:
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Assignee:
Japan Science and Technology Agency
International Classes:
B82B3/00; B81C99/00; C30B29/62; C30B29/66; G01Q70/00; G01Q70/12; G01Q70/16; G01Q90/00; (IPC1-7): B82B3/00; B81C5/00; C30B29/62; C30B29/66; G01N13/10; G12B21/02
Domestic Patent References:
JP2001281124A
JP9288115A
JP2001261316A
JP2001174491A
JP10203810A
JP2002179418A
JP2003090788A
JP2003114182A
JP58104095A
JP3209103A
JP2003240700A
Attorney, Agent or Firm:
Mamoru Shimizu